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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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In Situ Tensile and Fracture Behavior of Ultra-thin Amorphous Carbon in TEM
- Author(s)
- Yoon, Jongchan, Jang, Younggeun, Kim, Kangsik, Kim, Jaemin, Son, Seungwoo, Lee, Zonghoon
- Issued Date
- 2023-07-26
- Citation
- Microscopy & Microanalysis 2023
- Publisher
- Microscopy Society of America
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