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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.title | Microscopy & Microanalysis 2023 | - |
| dc.contributor.author | Yoon, Jongchan | - |
| dc.contributor.author | Jang, Younggeun | - |
| dc.contributor.author | Kim, Kangsik | - |
| dc.contributor.author | Kim, Jaemin | - |
| dc.contributor.author | Son, Seungwoo | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2024-01-03T16:35:12Z | - |
| dc.date.available | 2024-01-03T16:35:12Z | - |
| dc.date.created | 2024-01-02 | - |
| dc.date.issued | 2023-07-26 | - |
| dc.identifier.bibliographicCitation | Microscopy & Microanalysis 2023 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/67588 | - |
| dc.publisher | Microscopy Society of America | - |
| dc.title | In Situ Tensile and Fracture Behavior of Ultra-thin Amorphous Carbon in TEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2023-07-23 | - |
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