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- Jeong, Changwook
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Integration technologies for scalable high density MRAM
- Author(s)
- Park, J. H., Jeong, W. C., Oh, J. H., Jeong, Changwook, Shin, J. M., Hwang, Y. N., Ahn, S. J., Lee, S. H., Lee, S. Y., Ryoo, K. C., Park, Jonghyun, Yang, F., Koh, G. H., Jeong, G. T., Jeong, H. S., Kim, Kinam
- Issued Date
- 2005-04-25
- Citation
- International Symposium on VLSI Technology, pp.39 - 40
- Abstract
- We investigate the key factors for scalable high density MRAM. Specifically we examine problems such as large switching field, small sensing margin and writing disturbance following a decrease in size. We demonstrate these problems and suggest several solutions for realizing high density MRAM. © 2005 IEEE.
- Publisher
- IEEE
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