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- Bielawski, Christopher W.
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X-ray photoelectron spectroscopy investigation of the valence band offset at beryllium oxide-diamond interfaces (vol 101, 107647, 2020)
- Author(s)
- Koh, Donghyi, Hudnall, Todd W., Bielawski, Christopher W., Banerjee, Sanjay K., Brockman, Justin, Kuhn, Markus, King, Sean W.
- Issued Date
- 2021-01
- Citation
- DIAMOND AND RELATED MATERIALS, v.111, pp.108217
- Abstract
- DOI of original article: https://doi.org/10.1016/j.diamond.2019.107647.
- Publisher
- ELSEVIER SCIENCE SA
- ISSN
- 0925-9635
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