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- Bielawski, Christopher W.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.startPage | 108217 | - |
| dc.citation.title | DIAMOND AND RELATED MATERIALS | - |
| dc.citation.volume | 111 | - |
| dc.contributor.author | Koh, Donghyi | - |
| dc.contributor.author | Hudnall, Todd W. | - |
| dc.contributor.author | Bielawski, Christopher W. | - |
| dc.contributor.author | Banerjee, Sanjay K. | - |
| dc.contributor.author | Brockman, Justin | - |
| dc.contributor.author | Kuhn, Markus | - |
| dc.contributor.author | King, Sean W. | - |
| dc.date.accessioned | 2023-12-21T16:21:58Z | - |
| dc.date.available | 2023-12-21T16:21:58Z | - |
| dc.date.created | 2021-03-25 | - |
| dc.date.issued | 2021-01 | - |
| dc.description.abstract | DOI of original article: https://doi.org/10.1016/j.diamond.2019.107647. | - |
| dc.identifier.bibliographicCitation | DIAMOND AND RELATED MATERIALS, v.111, pp.108217 | - |
| dc.identifier.doi | 10.1016/j.diamond.2020.108217 | - |
| dc.identifier.issn | 0925-9635 | - |
| dc.identifier.scopusid | 2-s2.0-85097888570 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/55409 | - |
| dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S092596352030772X?via%3Dihub | - |
| dc.identifier.wosid | 000612813500007 | - |
| dc.language | 영어 | - |
| dc.publisher | ELSEVIER SCIENCE SA | - |
| dc.title | X-ray photoelectron spectroscopy investigation of the valence band offset at beryllium oxide-diamond interfaces (vol 101, 107647, 2020) | - |
| dc.type | Article | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter | - |
| dc.relation.journalResearchArea | Materials Science; Physics | - |
| dc.type.docType | Correction | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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