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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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A Low-Voltage Microwave Plasma Ionizer With Reduced Electric Overstress Due to Displacement Current Coupling From a High-AC Voltage Source

Author(s)
Bae, ByungjinKim, Jingook
Issued Date
2021-10
DOI
10.1109/TEMC.2021.3050492
URI
https://scholarworks.unist.ac.kr/handle/201301/54827
Fulltext
https://ieeexplore.ieee.org/document/9339869
Citation
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.63, no.5, pp.1501 - 1511
Abstract
A low-voltage microwave plasma ionizer was proposed as an ac-type ionizer. A structure to improve the ionizing performance and stability of the plasma ionizer was proposed. A dedicated source module was also designed to generate microwave power for the ionizer. The ionizing performance of the proposed ionizer was experimentally investigated using a charged plate monitor, and the factors required to achieve good performance were found. The risk of electric overstress due to displacement current coupling from the ac voltage source in the ionizer was then investigated. It was experimentally confirmed that the proposed microwave plasma ionizer has a much lower risk of electric overstress at a close distance than a conventional ac-type corona ionizer.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
ISSN
0018-9375
Keyword (Author)
PlasmasResonatorsCoronaFansMicrowave oscillatorsResonant frequencyRadio frequencyAC-type ionizercharged plate monitor (CPM)decay timedisplacement currentelectric overstress (EOS)electrostatic discharge (ESD)low-voltagemicrowaveoffset voltageplasma ionizerslot resonatorsource module
Keyword
BREAKDOWNTEMPERATURE

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