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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.endPage 1511 -
dc.citation.number 5 -
dc.citation.startPage 1501 -
dc.citation.title IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY -
dc.citation.volume 63 -
dc.contributor.author Bae, Byungjin -
dc.contributor.author Kim, Jingook -
dc.date.accessioned 2023-12-21T15:10:49Z -
dc.date.available 2023-12-21T15:10:49Z -
dc.date.created 2021-11-11 -
dc.date.issued 2021-10 -
dc.description.abstract A low-voltage microwave plasma ionizer was proposed as an ac-type ionizer. A structure to improve the ionizing performance and stability of the plasma ionizer was proposed. A dedicated source module was also designed to generate microwave power for the ionizer. The ionizing performance of the proposed ionizer was experimentally investigated using a charged plate monitor, and the factors required to achieve good performance were found. The risk of electric overstress due to displacement current coupling from the ac voltage source in the ionizer was then investigated. It was experimentally confirmed that the proposed microwave plasma ionizer has a much lower risk of electric overstress at a close distance than a conventional ac-type corona ionizer. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.63, no.5, pp.1501 - 1511 -
dc.identifier.doi 10.1109/TEMC.2021.3050492 -
dc.identifier.issn 0018-9375 -
dc.identifier.scopusid 2-s2.0-85100463655 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/54827 -
dc.identifier.url https://ieeexplore.ieee.org/document/9339869 -
dc.identifier.wosid 000707443900030 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title A Low-Voltage Microwave Plasma Ionizer With Reduced Electric Overstress Due to Displacement Current Coupling From a High-AC Voltage Source -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Telecommunications -
dc.relation.journalResearchArea Engineering; Telecommunications -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Plasmas -
dc.subject.keywordAuthor Resonators -
dc.subject.keywordAuthor Corona -
dc.subject.keywordAuthor Fans -
dc.subject.keywordAuthor Microwave oscillators -
dc.subject.keywordAuthor Resonant frequency -
dc.subject.keywordAuthor Radio frequency -
dc.subject.keywordAuthor AC-type ionizer -
dc.subject.keywordAuthor charged plate monitor (CPM) -
dc.subject.keywordAuthor decay time -
dc.subject.keywordAuthor displacement current -
dc.subject.keywordAuthor electric overstress (EOS) -
dc.subject.keywordAuthor electrostatic discharge (ESD) -
dc.subject.keywordAuthor low-voltage -
dc.subject.keywordAuthor microwave -
dc.subject.keywordAuthor offset voltage -
dc.subject.keywordAuthor plasma ionizer -
dc.subject.keywordAuthor slot resonator -
dc.subject.keywordAuthor source module -
dc.subject.keywordPlus BREAKDOWN -
dc.subject.keywordPlus TEMPERATURE -

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