BROWSE

Related Researcher

Author's Photo

Kim, Dai-Sik
Research Interests

ITEM VIEW & DOWNLOAD

Ultra-Narrow Metallic Nano-Trenches Realized by Wet Etching and Critical Point Drying

Cited 0 times inthomson ciCited 0 times inthomson ci
Title
Ultra-Narrow Metallic Nano-Trenches Realized by Wet Etching and Critical Point Drying
Author
Jeong, JeeyoonYang, HyosimPark, SeondoPark, Yun DanielKim, Dai-Sik
Issue Date
2021-03
Publisher
MDPI
Citation
NANOMATERIALS, v.11, no.3, pp.783
Abstract
A metallic nano-trench is a unique optical structure capable of ultrasensitive detection of molecules, active modulation as well as potential electrochemical applications. Recently, wet-etching the dielectrics of metal-insulator-metal structures has emerged as a reliable method of creating optically active metallic nano-trenches with a gap width of 10 nm or less, opening a new venue for studying the dynamics of nanoconfined molecules. Yet, the high surface tension of water in the process of drying leaves the nano-trenches vulnerable to collapsing, limiting the achievable width to no less than 5 nm. In this work, we overcome the technical limit and realize metallic nano-trenches with widths as small as 1.5 nm. The critical point drying technique significantly alleviates the stress applied to the gap in the drying process, keeping the ultra-narrow gap from collapsing. Terahertz spectroscopy of the trenches clearly reveals the signature of successful wet etching of the dielectrics without apparent damage to the gap. We expect that our work will enable various optical and electrochemical studies at a few-molecules-thick level.
URI
https://scholarworks.unist.ac.kr/handle/201301/52969
URL
https://www.mdpi.com/2079-4991/11/3/783
DOI
10.3390/nano11030783
ISSN
2079-4991
Appears in Collections:
PHY_Journal Papers
Files in This Item:
000633949700001.pdf Download

find_unist can give you direct access to the published full text of this article. (UNISTARs only)

Show full item record

qrcode

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

MENU