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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Quantitative in-situ uniaxial compression testing in a transmission electron microscope
- Author(s)
- Lee, Zonghoon, None
- Issued Date
- 2007-06-18
- Citation
- Multinational Congress on Microscopy
- Publisher
- Multinational Congress on Microscopy
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