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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | CS | - |
| dc.citation.title | Multinational Congress on Microscopy | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.contributor.author | None | - |
| dc.date.accessioned | 2023-12-20T05:06:01Z | - |
| dc.date.available | 2023-12-20T05:06:01Z | - |
| dc.date.created | 2014-12-23 | - |
| dc.date.issued | 2007-06-18 | - |
| dc.identifier.bibliographicCitation | Multinational Congress on Microscopy | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/51845 | - |
| dc.publisher | Multinational Congress on Microscopy | - |
| dc.title | Quantitative in-situ uniaxial compression testing in a transmission electron microscope | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2007-06-18 | - |
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