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- Yoon, Tae-Sik
- Nano Semiconductor Research Lab.
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Resistive switching characteristics of patterned Cr/ZnO/Cr thin film structure
- Author(s)
- Yoo, E.J., Yoon, Tae-Sik, Choi, Y.J., Kang, C.J.
- Issued Date
- 2012-08-20
- Citation
- 2012 12th IEEE International Conference on Nanotechnology, NANO 2012
- Abstract
- Current-voltage (I-V) characteristics of the Cr/ZnO/Cr capacitor structure was investigated. A bipolar resistive switching behavior was observed in the patterned structure of Cr/ZnO/Cr. In addition, using Cr coated AFM tip as a top electrode, the electrical characteristics of local area of ZnO/Cr structure was measured and compared with that of capacitor structure. © 2012 IEEE.
- Publisher
- IEEE
- ISSN
- 1944-9399
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