File Download

There are no files associated with this item.

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

김소연

Kim, So Youn
Laboratory for Soft Materials Nanophysics
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

Nanoscratch-Directed Self-Assembly of Block Copolymer Thin Films

Author(s)
Kim, Dong HyupSuh, AhramPark, GeonhyeongYoon, Dong KiKim, So Youn
Issued Date
2021-02
DOI
10.1021/acsami.0c19665
URI
https://scholarworks.unist.ac.kr/handle/201301/50574
Fulltext
https://pubs.acs.org/doi/10.1021/acsami.0c19665
Citation
ACS APPLIED MATERIALS & INTERFACES, v.13, no.4, pp.5772 - 5781
Abstract
Directed self-assembly (DSA) of block copolymer (BCP) thin films is of particular interest in nanoscience and nanotechnology due to its superior ability to form various well-aligned nanopatterns. Herein, nanoscratch-DSA is introduced as a simple and scalable DSA strategy allowing highly aligned BCP nanopatterns over a large area. A gentle scratching on the target substrate with a commercial diamond lapping film can form uniaxially aligned nanoscratches. As applied in BCP thin films, the nanoscratch effectively guides the self-assembly of overlying BCPs and provides highly aligned nanopatterns along the direction of the nanoscratch. The nanoscratch-DSA is not material-specific, allowing more versatile nanofabrication for various functional nanomaterials. In addition, we demonstrate that the nanoscratch-DSA can be utilized as a direction-controllable and area-selective nanofabrication method.
Publisher
AMER CHEMICAL SOC
ISSN
1944-8244
Keyword (Author)
block copolymersself-assemblythin filmsdirected self-assemblynanopatterningnanoscratch

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.