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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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Deca-nanoscale maximum gate length of plasma wave transistor for operating terahertz emitter based on strained silicon platform

Author(s)
Park, Jong YulKim, Sung-HoKim, Kyung Rok
Issued Date
2014-08-19
DOI
10.1109/NANO.2014.6968155
URI
https://scholarworks.unist.ac.kr/handle/201301/46911
Fulltext
https://ieeexplore.ieee.org/document/6968155
Citation
2014 14th IEEE International Conference on Nanotechnology, pp.150 - 153
Abstract
In this work, we have shown that plasma-wave transistor (PWT) operates as a terahertz (THz) emitter below maximum gate length (Lmax). Because the channel mobility (p) of strained silicon (sSi) is higher than silicon (Si), we investigate how emission frequency range and Lmax of sSi PWT THz emitter are improved compared to Si PWT THz emitter by analyzing the effect of momentum relaxation time (rp) and electron effective mass (m) on a design window of PWT THz emitter.
Publisher
IEEE
ISBN
978-147995622-7
ISSN
1944-9399

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