2015 Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe, pp.1310 - 1314
Abstract
The step response of a single ended output driver with silicon interposer channel is derived including the parasitics of ESD protection circuits. The probability density functions of the output voltage due to supply voltage fluctuations are also analytically calculated. With changing the frequency of supply voltage fluctuations, the effect of ESD parasitics on the output jitter is calculated and compared.
Publisher
IEEE International Symposium on Electromagnetic Compatibility and EMC Europe