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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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Effects of Contact Size and Schottky Barrier Height on Nanoscale Contact Resistance

Author(s)
Kim, Kyung Rok
Issued Date
2011
URI
https://scholarworks.unist.ac.kr/handle/201301/46182
Citation
International Microprocesses and Nanotechnology Conference (MNC 2011)
Publisher
The Japan Society of Applied P

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