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- Kim, Kyung Rok
- Nano-Electronic Emerging Devices Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | International Microprocesses and Nanotechnology Conference (MNC 2011) | - |
| dc.contributor.author | Kim, Kyung Rok | - |
| dc.date.accessioned | 2023-12-20T03:08:32Z | - |
| dc.date.available | 2023-12-20T03:08:32Z | - |
| dc.date.created | 2013-07-17 | - |
| dc.date.issued | 2011 | - |
| dc.identifier.bibliographicCitation | International Microprocesses and Nanotechnology Conference (MNC 2011) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/46182 | - |
| dc.language | 영어 | - |
| dc.publisher | The Japan Society of Applied P | - |
| dc.title | Effects of Contact Size and Schottky Barrier Height on Nanoscale Contact Resistance | - |
| dc.type | Conference Paper | - |
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