File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Shin, Heungjoo
- Micro/Nano Integrated Systems Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Alternating Current (AC) Impedence Imaging with Combined Atomic Force Scanning Electrochemical Microscopy (AFM-SECM)
- Author(s)
- Shin, Heungjoo, Eckhard, K., Mizaikoff, B., Schuhmann, W., Kranz, C.
- Issued Date
- 2007-05-08
- Citation
- ECS 211th Meeting
- Publisher
- The Electrochemical Society
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.