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- Shin, Heungjoo
- Micro/Nano Integrated Systems Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Chicago, Illinois | - |
| dc.citation.title | ECS 211th Meeting | - |
| dc.contributor.author | Shin, Heungjoo | - |
| dc.contributor.author | Eckhard, K. | - |
| dc.contributor.author | Mizaikoff, B. | - |
| dc.contributor.author | Schuhmann, W. | - |
| dc.contributor.author | Kranz, C. | - |
| dc.date.accessioned | 2023-12-20T05:06:19Z | - |
| dc.date.available | 2023-12-20T05:06:19Z | - |
| dc.date.created | 2014-12-23 | - |
| dc.date.issued | 2007-05-08 | - |
| dc.identifier.bibliographicCitation | ECS 211th Meeting | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/45273 | - |
| dc.publisher | The Electrochemical Society | - |
| dc.title | Alternating Current (AC) Impedence Imaging with Combined Atomic Force Scanning Electrochemical Microscopy (AFM-SECM) | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2007-05-08 | - |
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