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Jeong, Hu Young
UCRF Electron Microscopy group
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Analytical Transmission Electron Microscopy Study on the Oxygen Defect Formation of Ti Oxide Thin Films Sandwiched between Al Electrodes

Author(s)
Jeong, Hu Young
Issued Date
2007-04-12
URI
https://scholarworks.unist.ac.kr/handle/201301/44038
Citation
2007 Materials Research Society Spring Meeting
Publisher
Materials Research Society

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