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- Jeong, Hu Young
- UCRF Electron Microscopy group
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.title | 2007 Materials Research Society Spring Meeting | - |
| dc.contributor.author | Jeong, Hu Young | - |
| dc.date.accessioned | 2023-12-20T05:06:32Z | - |
| dc.date.available | 2023-12-20T05:06:32Z | - |
| dc.date.created | 2015-11-26 | - |
| dc.date.issued | 2007-04-12 | - |
| dc.identifier.bibliographicCitation | 2007 Materials Research Society Spring Meeting | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/44038 | - |
| dc.publisher | Materials Research Society | - |
| dc.title | Analytical Transmission Electron Microscopy Study on the Oxygen Defect Formation of Ti Oxide Thin Films Sandwiched between Al Electrodes | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2007-04-09 | - |
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