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Jeong, Hu Young
UCRF Electron Microscopy group
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Direct observation of interface region between multi-layer graphene and Ni using Cs-corrected STEM

Author(s)
Jeong, Hu Young
Issued Date
2011-05-23
URI
https://scholarworks.unist.ac.kr/handle/201301/43612
Citation
5th Congress of the International Union of Microbeam Analysis Societies/8th international Symposium on Atomic Level Characterization for New Materials and Devices’11)
Publisher
International Union of Microbeam Analysis Society

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