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- Jeong, Hu Young
- UCRF Electron Microscopy group
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 5th Congress of the International Union of Microbeam Analysis Societies/8th international Symposium on Atomic Level Characterization for New Materials and Devices’11) | - |
| dc.contributor.author | Jeong, Hu Young | - |
| dc.date.accessioned | 2023-12-20T03:06:40Z | - |
| dc.date.available | 2023-12-20T03:06:40Z | - |
| dc.date.created | 2015-11-26 | - |
| dc.date.issued | 2011-05-23 | - |
| dc.identifier.bibliographicCitation | 5th Congress of the International Union of Microbeam Analysis Societies/8th international Symposium on Atomic Level Characterization for New Materials and Devices’11) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/43612 | - |
| dc.publisher | International Union of Microbeam Analysis Society | - |
| dc.title | Direct observation of interface region between multi-layer graphene and Ni using Cs-corrected STEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2011-05-22 | - |
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