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Shin, Hyung-Joon
Nanoscale Materials Science Lab.
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Mapping of Surface Potential and Capacitance Spectroscopy of Silicon Nanocrystals Using Scanning Probe Microscopy

Author(s)
Shin, Hyung-Joon
Issued Date
2005-07-01
URI
https://scholarworks.unist.ac.kr/handle/201301/42417
Citation
STM 05
Publisher
STM 05

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