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- Shin, Hyung-Joon
- Nanoscale Materials Science Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | JA | - |
| dc.citation.conferencePlace | Sapporo | - |
| dc.citation.title | STM 05 | - |
| dc.contributor.author | Shin, Hyung-Joon | - |
| dc.date.accessioned | 2023-12-20T05:36:26Z | - |
| dc.date.available | 2023-12-20T05:36:26Z | - |
| dc.date.created | 2014-12-23 | - |
| dc.date.issued | 2005-07-01 | - |
| dc.identifier.bibliographicCitation | STM 05 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/42417 | - |
| dc.language | 영어 | - |
| dc.publisher | STM 05 | - |
| dc.title | Mapping of Surface Potential and Capacitance Spectroscopy of Silicon Nanocrystals Using Scanning Probe Microscopy | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2005-07-01 | - |
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