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이종훈

Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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Deep-learning Based Transmission Electron Microscopy with Generative Adversarial Networks

Author(s)
이종영이종훈
Issued Date
2017-12-14
URI
https://scholarworks.unist.ac.kr/handle/201301/39208
Citation
2017 KGPF Annual Conference
Publisher
Korea Global Ph.D. Fellows

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