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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2017 KGPF Annual Conference | - |
| dc.contributor.author | 이종영 | - |
| dc.contributor.author | 이종훈 | - |
| dc.date.accessioned | 2023-12-19T17:38:27Z | - |
| dc.date.available | 2023-12-19T17:38:27Z | - |
| dc.date.created | 2017-11-14 | - |
| dc.date.issued | 2017-12-14 | - |
| dc.identifier.bibliographicCitation | 2017 KGPF Annual Conference | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39208 | - |
| dc.language | 영어 | - |
| dc.publisher | Korea Global Ph.D. Fellows | - |
| dc.title | Deep-learning Based Transmission Electron Microscopy with Generative Adversarial Networks | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2017-12-04 | - |
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