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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Research Progress on Graphene and Other 2D Crystals at Atomic Scale using Low kV Aberration-Corrected TEM
- Author(s)
- Lee, Zonghoon
- Issued Date
- 2013
- Citation
- YICT Advanced Characterization Center Opening Workshop (invited talk)
- Publisher
- 연세대학교 첨단분석센터
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