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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 연세대학교 | - |
| dc.citation.title | YICT Advanced Characterization Center Opening Workshop (invited talk) | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2023-12-20T01:10:29Z | - |
| dc.date.available | 2023-12-20T01:10:29Z | - |
| dc.date.created | 2014-05-15 | - |
| dc.date.issued | 2013 | - |
| dc.identifier.bibliographicCitation | YICT Advanced Characterization Center Opening Workshop (invited talk) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39202 | - |
| dc.language | 한국어 | - |
| dc.publisher | 연세대학교 첨단분석센터 | - |
| dc.title | Research Progress on Graphene and Other 2D Crystals at Atomic Scale using Low kV Aberration-Corrected TEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2013 | - |
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