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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Atomic-scale Research on 2D Materials using Aberration-corrected TEM (invited talk)
- Author(s)
- Lee, Zonghoon, Ryu, Gyeong Hee, Park, Hyo ju, Kim, Jung Hwa, Kim, Na Yeon, Hong, Hyo-Ki
- Issued Date
- 2015-06-16
- Citation
- 2015 Collaborative Conference on 3D and Materials Research (invited talk)
- Publisher
- OAHOST
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