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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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DC Field Value Language
dc.citation.conferencePlace KO -
dc.citation.conferencePlace 부산 벡스코 -
dc.citation.title 2015 Collaborative Conference on 3D and Materials Research (invited talk) -
dc.contributor.author Lee, Zonghoon -
dc.contributor.author Ryu, Gyeong Hee -
dc.contributor.author Park, Hyo ju -
dc.contributor.author Kim, Jung Hwa -
dc.contributor.author Kim, Na Yeon -
dc.contributor.author Hong, Hyo-Ki -
dc.date.accessioned 2023-12-19T22:10:55Z -
dc.date.available 2023-12-19T22:10:55Z -
dc.date.created 2016-01-13 -
dc.date.issued 2015-06-16 -
dc.identifier.bibliographicCitation 2015 Collaborative Conference on 3D and Materials Research (invited talk) -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/39196 -
dc.language 영어 -
dc.publisher OAHOST -
dc.title Atomic-scale Research on 2D Materials using Aberration-corrected TEM (invited talk) -
dc.type Conference Paper -
dc.date.conferenceDate 2015-06-15 -

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