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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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Characterization of Defects in 2D Materials at Atomic Scale using Aberration Corrected Transmission Electron Microscopy (invited talk)
- Author(s)
- Lee, Zonghoon, Ryu, GyeongHee, Park, Hyo Ju, Kim, Jung Hwa, Kim, Na Yeon
- Issued Date
- 2015-11-12
- Citation
- International Symposium on Microscopy & Microanalysis of Materials 2015 (invited talk)
- Publisher
- International Symposium on Microscopy & Microanalysis of Materials
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