File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | International Symposium on Microscopy & Microanalysis of Materials 2015 (invited talk) | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.contributor.author | Ryu, GyeongHee | - |
| dc.contributor.author | Park, Hyo Ju | - |
| dc.contributor.author | Kim, Jung Hwa | - |
| dc.contributor.author | Kim, Na Yeon | - |
| dc.date.accessioned | 2023-12-19T21:36:43Z | - |
| dc.date.available | 2023-12-19T21:36:43Z | - |
| dc.date.created | 2016-01-13 | - |
| dc.date.issued | 2015-11-12 | - |
| dc.identifier.bibliographicCitation | International Symposium on Microscopy & Microanalysis of Materials 2015 (invited talk) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39191 | - |
| dc.language | 영어 | - |
| dc.publisher | International Symposium on Microscopy & Microanalysis of Materials | - |
| dc.title | Characterization of Defects in 2D Materials at Atomic Scale using Aberration Corrected Transmission Electron Microscopy (invited talk) | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2015-11-11 | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.