File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Study on Defects in 2D Materials using Atomic Resolution TEM (invited talk)
- Issued Date
- 2016-02-18
- Citation
- 제 50회 한국진공학회 학술대회 (invited talk)
- Publisher
- 한국진공학회
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.