File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 무주 | - |
| dc.citation.title | 제 50회 한국진공학회 학술대회 (invited talk) | - |
| dc.contributor.author | 류경희 | - |
| dc.contributor.author | 박효주 | - |
| dc.contributor.author | 김정화 | - |
| dc.contributor.author | 김나연 | - |
| dc.contributor.author | 이종영 | - |
| dc.contributor.author | 이종훈 | - |
| dc.date.accessioned | 2023-12-19T21:09:02Z | - |
| dc.date.available | 2023-12-19T21:09:02Z | - |
| dc.date.created | 2017-01-10 | - |
| dc.date.issued | 2016-02-18 | - |
| dc.identifier.bibliographicCitation | 제 50회 한국진공학회 학술대회 (invited talk) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39189 | - |
| dc.identifier.url | http://www.dbpia.co.kr/Journal/ArticleDetail/NODE06637729 | - |
| dc.language | 영어 | - |
| dc.publisher | 한국진공학회 | - |
| dc.title | Study on Defects in 2D Materials using Atomic Resolution TEM (invited talk) | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2016-02-18 | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.