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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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STUDY ON STRUCTURE AND DEFECTS OF 2D MATERIALS USING ATOMIC RESOLUTION TEM
- Author(s)
- Ryu, GH, Park, HJ, Kim, JH, Hong, HG, Lee, Zonghoon
- Issued Date
- 2017-06-27
- Citation
- 13th International Conference on Diffusion in Solids and Liquids (invited talk)
- Publisher
- DSL 2017
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