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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | AU | - |
| dc.citation.title | 13th International Conference on Diffusion in Solids and Liquids (invited talk) | - |
| dc.contributor.author | Ryu, GH | - |
| dc.contributor.author | Park, HJ | - |
| dc.contributor.author | Kim, JH | - |
| dc.contributor.author | Hong, HG | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2023-12-19T18:39:34Z | - |
| dc.date.available | 2023-12-19T18:39:34Z | - |
| dc.date.created | 2017-11-14 | - |
| dc.date.issued | 2017-06-27 | - |
| dc.identifier.bibliographicCitation | 13th International Conference on Diffusion in Solids and Liquids (invited talk) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39140 | - |
| dc.language | 영어 | - |
| dc.publisher | DSL 2017 | - |
| dc.title | STUDY ON STRUCTURE AND DEFECTS OF 2D MATERIALS USING ATOMIC RESOLUTION TEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2017-06-26 | - |
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