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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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Modeling and RF Analysis of Silicon Inter-Band Tunnel Diode with THz Cut-Off Frequency

Author(s)
Kim, Kyung RokKang, In ManDutton, Robert W.
Issued Date
2010-06-13
DOI
10.1109/SNW.2010.5562553
URI
https://scholarworks.unist.ac.kr/handle/201301/35763
Fulltext
https://ieeexplore.ieee.org/document/5562553
Citation
2010 15th Silicon Nanoelectronics Workshop, SNW 2010
Abstract
We demonstrated RF analysis framework based on tunnel velocity model for Si IBT diodes with ultra-thin tunnel barriers. Microwave and sub-millimeter wave properties of the non-linear NDR characteristics have been investigated in a numerical way with various structural design. The intrinsic cut-off frequency can be obtained up to THz-level for highly doped nanoscale Si tunnel junctions.
Publisher
2010 15th Silicon Nanoelectronics Workshop, SNW 2010

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