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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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dc.citation.conferencePlace US -
dc.citation.conferencePlace Honolulu, HI -
dc.citation.title 2010 15th Silicon Nanoelectronics Workshop, SNW 2010 -
dc.contributor.author Kim, Kyung Rok -
dc.contributor.author Kang, In Man -
dc.contributor.author Dutton, Robert W. -
dc.date.accessioned 2023-12-20T03:37:23Z -
dc.date.available 2023-12-20T03:37:23Z -
dc.date.created 2013-07-17 -
dc.date.issued 2010-06-13 -
dc.description.abstract We demonstrated RF analysis framework based on tunnel velocity model for Si IBT diodes with ultra-thin tunnel barriers. Microwave and sub-millimeter wave properties of the non-linear NDR characteristics have been investigated in a numerical way with various structural design. The intrinsic cut-off frequency can be obtained up to THz-level for highly doped nanoscale Si tunnel junctions. -
dc.identifier.bibliographicCitation 2010 15th Silicon Nanoelectronics Workshop, SNW 2010 -
dc.identifier.doi 10.1109/SNW.2010.5562553 -
dc.identifier.scopusid 2-s2.0-77958005856 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/35763 -
dc.identifier.url https://ieeexplore.ieee.org/document/5562553 -
dc.language 영어 -
dc.publisher 2010 15th Silicon Nanoelectronics Workshop, SNW 2010 -
dc.title Modeling and RF Analysis of Silicon Inter-Band Tunnel Diode with THz Cut-Off Frequency -
dc.type Conference Paper -
dc.date.conferenceDate 2010-06-13 -

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