dc.citation.conferencePlace |
CC |
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dc.citation.title |
7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016 |
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dc.contributor.author |
Park, Myungjoon |
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dc.contributor.author |
Park, Junsik |
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dc.contributor.author |
Seung, Manho |
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dc.contributor.author |
Choi, Joungcheul |
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dc.contributor.author |
Lee, Changyeol |
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dc.contributor.author |
Lee, Seokkiu |
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dc.contributor.author |
Kim, Jingook |
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dc.date.accessioned |
2023-12-19T20:39:30Z |
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dc.date.available |
2023-12-19T20:39:30Z |
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dc.date.created |
2017-01-10 |
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dc.date.issued |
2016-05-17 |
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dc.description.abstract |
Electromagnetic noise source of an integrated circuit (IC) can be approximately modeled with three dipole moments. To improve the previous dipole moments extraction method using 3 TEM cell measurements data, a new dipole moments extraction technique using 24 measurements data in a GTEM cell is proposed herein. The nonlinear least square (NLS) method is applied to accurately extract the three dipole moments including the relative phases of each dipole moment. The near- magnetic field patterns calculated using the improved dipole moments extraction method are compared with those using the previous method. |
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dc.identifier.bibliographicCitation |
7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016 |
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dc.identifier.doi |
10.1109/APEMC.2016.7522819 |
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dc.identifier.scopusid |
2-s2.0-84983672169 |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/35413 |
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dc.identifier.url |
http://ieeexplore.ieee.org/document/7522819/ |
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dc.language |
영어 |
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dc.publisher |
APEMC 2016 |
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dc.title |
Measurement and Modeling of System-level ESD Noise Voltages in Real Mobile Products |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2016-05-17 |
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