Measurement and Modeling of System-level ESD Noise Voltages in Real Mobile Products

Abstract

Electromagnetic noise source of an integrated circuit (IC) can be approximately modeled with three dipole moments. To improve the previous dipole moments extraction method using 3 TEM cell measurements data, a new dipole moments extraction technique using 24 measurements data in a GTEM cell is proposed herein. The nonlinear least square (NLS) method is applied to accurately extract the three dipole moments including the relative phases of each dipole moment. The near- magnetic field patterns calculated using the improved dipole moments extraction method are compared with those using the previous method.