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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Garden Grove (Anaheim) | - |
| dc.citation.title | 2016 EOS/ESD Symposium | - |
| dc.contributor.author | Park, Junsik | - |
| dc.contributor.author | Lee, Jongsung | - |
| dc.contributor.author | Kim, Seongmoo | - |
| dc.contributor.author | Jo, Cheolgu | - |
| dc.contributor.author | Seol, Byongsu | - |
| dc.contributor.author | Kim, Jingook | - |
| dc.date.accessioned | 2023-12-19T20:09:28Z | - |
| dc.date.available | 2023-12-19T20:09:28Z | - |
| dc.date.created | 2017-01-10 | - |
| dc.date.issued | 2016-09-11 | - |
| dc.description.abstract | The discharging currents through an IC induced by the charged board event (CBE) is measured using a shielded Rogowski coil. Several shielding techniques are applied in the measurement to reduce the common mode noise and the unexpected electric field coupling. The measured results are validated with the CBE circuit simulations. | - |
| dc.identifier.bibliographicCitation | 2016 EOS/ESD Symposium | - |
| dc.identifier.doi | 10.1109/EOSESD.2016.7592537 | - |
| dc.identifier.issn | 0739-5159 | - |
| dc.identifier.scopusid | 2-s2.0-85008931506 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/35383 | - |
| dc.identifier.url | http://ieeexplore.ieee.org/document/7592537/ | - |
| dc.language | 영어 | - |
| dc.publisher | 2016 EOS/ESD Symposium | - |
| dc.title | Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski Coil | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2016-09-11 | - |
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