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A novel design methodology for error-resilient circuits in near-Threshold computing

Author(s)
Lee, JaeminKim, SunmeanKim, YoungminKang, Seokhyeong
Issued Date
2016-10-26
DOI
10.1109/ICCE-Asia.2016.7804807
URI
https://scholarworks.unist.ac.kr/handle/201301/35359
Fulltext
http://ieeexplore.ieee.org/document/7804807
Citation
2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016
Abstract
Recently, supply voltage has been reduced for low power applications, and near threshold computing (NTC) is considered as a promising solution for optimal energy efficiency. However, NTC suffers a significant performance degradation, which is prone to timing errors. Thus, in order to improve the reliability of NTC operations, error-resilient techniques are indispensable, though they cause area and power overheads. In this paper, we propose a design methodology which provides an optimal implementation of error-resilient circuits. A modified Quine-McCluskey (Q-M) algorithm is exploited to earn the minimum set of error-resilient circuits without any loss of detection ability. From the proposed design flow, benchmark results show that optimal design reduces up to 72% of required flip-flops to be changed to error-resilient circuits without compromising an error detection ability.
Publisher
IEEE

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