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- Kim, Kwanpyo
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Grain Boundary Mapping in Polycrystalline Graphene
- Author(s)
- Kim, Kwanpyo, Lee, Zonghoon, Regan, William, Kisielowski, C., Crommie, M. F., Zettl, A.
- Issued Date
- 2011-03
- Citation
- ACS NANO, v.5, no.3, pp.2142 - 2146
- Abstract
- We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.
- Publisher
- AMER CHEMICAL SOC
- ISSN
- 1936-0851
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