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DC Field | Value | Language |
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dc.citation.endPage | 2146 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 2142 | - |
dc.citation.title | ACS NANO | - |
dc.citation.volume | 5 | - |
dc.contributor.author | Kim, Kwanpyo | - |
dc.contributor.author | Lee, Zonghoon | - |
dc.contributor.author | Regan, William | - |
dc.contributor.author | Kisielowski, C. | - |
dc.contributor.author | Crommie, M. F. | - |
dc.contributor.author | Zettl, A. | - |
dc.date.accessioned | 2023-12-22T06:36:08Z | - |
dc.date.available | 2023-12-22T06:36:08Z | - |
dc.date.created | 2013-06-12 | - |
dc.date.issued | 2011-03 | - |
dc.description.abstract | We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies. | - |
dc.identifier.bibliographicCitation | ACS NANO, v.5, no.3, pp.2142 - 2146 | - |
dc.identifier.doi | 10.1021/nn1033423 | - |
dc.identifier.issn | 1936-0851 | - |
dc.identifier.scopusid | 2-s2.0-79952936581 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/3229 | - |
dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=79952936581 | - |
dc.identifier.wosid | 000288570600071 | - |
dc.language | 영어 | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.title | Grain Boundary Mapping in Polycrystalline Graphene | - |
dc.type | Article | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary | - |
dc.relation.journalResearchArea | Chemistry; Science & Technology - Other Topics; Materials Science | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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