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김관표

Kim, Kwanpyo
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dc.citation.endPage 2146 -
dc.citation.number 3 -
dc.citation.startPage 2142 -
dc.citation.title ACS NANO -
dc.citation.volume 5 -
dc.contributor.author Kim, Kwanpyo -
dc.contributor.author Lee, Zonghoon -
dc.contributor.author Regan, William -
dc.contributor.author Kisielowski, C. -
dc.contributor.author Crommie, M. F. -
dc.contributor.author Zettl, A. -
dc.date.accessioned 2023-12-22T06:36:08Z -
dc.date.available 2023-12-22T06:36:08Z -
dc.date.created 2013-06-12 -
dc.date.issued 2011-03 -
dc.description.abstract We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies. -
dc.identifier.bibliographicCitation ACS NANO, v.5, no.3, pp.2142 - 2146 -
dc.identifier.doi 10.1021/nn1033423 -
dc.identifier.issn 1936-0851 -
dc.identifier.scopusid 2-s2.0-79952936581 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/3229 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=79952936581 -
dc.identifier.wosid 000288570600071 -
dc.language 영어 -
dc.publisher AMER CHEMICAL SOC -
dc.title Grain Boundary Mapping in Polycrystalline Graphene -
dc.type Article -
dc.relation.journalWebOfScienceCategory Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary -
dc.relation.journalResearchArea Chemistry; Science & Technology - Other Topics; Materials Science -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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