Real-Time Test-Bed System Development Using Power Hardware-in-the-Loop (PHIL) Simulation Technique for Reliability Test of DC Nano Grid
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- Real-Time Test-Bed System Development Using Power Hardware-in-the-Loop (PHIL) Simulation Technique for Reliability Test of DC Nano Grid
- Heo, Kyung-Wook; Hyun, Jun; Jung, Jee-Hoon
- Issue Date
- SPRINGER HEIDELBER
- JOURNAL OF POWER ELECTRONICS, v.20, no.3, pp.784 - 793
- Since various power sources such as renewable energy and energy storage systems (ESSs) are connected to the DC grid, the reliability of the grid system is significant. However, the configuration of an actual DC grids for testing the reliability of the grid system is inconvenient, expensive and dangerous. In this paper, a test-bed system made up of a 20-kW DC nano grid and a control algorithm considering an external grid based on Power Hardware-in-the-Loop (PHIL) simulation are proposed to demonstrate the reliability of the DC grid. Using the PHIL simulation technique, target grids can be safely implemented with laboratory-level instruments and simulated by real-time simulators, which emulates grid operations that are similar to the actual grid. In addition, using the proposed control algorithm, the operations of grid-connected converters are demonstrated according to the grid-connected or islanding modes. Finally, the reliability of the simulated DC nano grid and the effectiveness of the grid-connected converter are verified using the PHIL simulation system with 3-kW prototype converters.
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