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정지훈

Jung, Jee-Hoon
Advanced Power Interface & Power Electronics Lab.
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dc.citation.endPage 793 -
dc.citation.number 3 -
dc.citation.startPage 784 -
dc.citation.title JOURNAL OF POWER ELECTRONICS -
dc.citation.volume 20 -
dc.contributor.author Heo, Kyung-Wook -
dc.contributor.author Hyun, Jun -
dc.contributor.author Jung, Jee-Hoon -
dc.date.accessioned 2023-12-21T17:39:30Z -
dc.date.available 2023-12-21T17:39:30Z -
dc.date.created 2020-03-12 -
dc.date.issued 2020-05 -
dc.description.abstract Since various power sources such as renewable energy and energy storage systems (ESSs) are connected to the DC grid, the reliability of the grid system is significant. However, the configuration of an actual DC grids for testing the reliability of the grid system is inconvenient, expensive and dangerous. In this paper, a test-bed system made up of a 20-kW DC nano grid and a control algorithm considering an external grid based on Power Hardware-in-the-Loop (PHIL) simulation are proposed to demonstrate the reliability of the DC grid. Using the PHIL simulation technique, target grids can be safely implemented with laboratory-level instruments and simulated by real-time simulators, which emulates grid operations that are similar to the actual grid. In addition, using the proposed control algorithm, the operations of grid-connected converters are demonstrated according to the grid-connected or islanding modes. Finally, the reliability of the simulated DC nano grid and the effectiveness of the grid-connected converter are verified using the PHIL simulation system with 3-kW prototype converters. -
dc.identifier.bibliographicCitation JOURNAL OF POWER ELECTRONICS, v.20, no.3, pp.784 - 793 -
dc.identifier.doi 10.1007/s43236-020-00075-x -
dc.identifier.issn 1598-2092 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/31552 -
dc.identifier.url https://link.springer.com/article/10.1007/s43236-020-00075-x -
dc.identifier.wosid 000522926600004 -
dc.language 영어 -
dc.publisher SPRINGER HEIDELBER -
dc.title Real-Time Test-Bed System Development Using Power Hardware-in-the-Loop (PHIL) Simulation Technique for Reliability Test of DC Nano Grid -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic 문서 정보 -
dc.relation.journalResearchArea Engineering -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.description.journalRegisteredClass kci -
dc.subject.keywordAuthor Power hardware-in-the-loop (PHIL) simulation -
dc.subject.keywordAuthor DC nano grid -
dc.subject.keywordAuthor DC bus signaling (DBS) -
dc.subject.keywordAuthor Grid power failure -
dc.subject.keywordAuthor DC -
dc.subject.keywordAuthor DC converter -
dc.subject.keywordAuthor AC -
dc.subject.keywordPlus DISTRIBUTED GENERATION -
dc.subject.keywordPlus PLATFORM -
dc.subject.keywordPlus DESIGN -

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