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정홍식

Jeong, Hongsik
Future Semiconductor Technology Lab.
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Field assisted spin switching in magnetic random access memory

Author(s)
Jeong, W.C.Park, J.H.Oh, J.H.Koh, G.H.Jeong, G.T.Jeong, H.S.Kim, K.
Issued Date
2006-04
DOI
10.1063/1.2172578
URI
https://scholarworks.unist.ac.kr/handle/201301/27158
Fulltext
https://aip.scitation.org/doi/10.1063/1.2172578
Citation
JOURNAL OF APPLIED PHYSICS, v.99, no.8, pp.08H708
Abstract
A switching method called by field assisted spin switching has been investigated. A field assisted spin switching consists of a metal line induced magnetic field and a spin switching through a magnetic tunnel junction. It is a variation of a current induced switching and assisted by the magnetic field induced by the current-carrying metal line. Various current paths have been tested to investigate how and how much the spin switching contributes to the overall switching and the results will be explained. A computer simulation has been complemented to measure the degree of the thermal effect in the switching.
Publisher
AMER INST PHYSICS
ISSN
0021-8979

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