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Jeong, Hongsik
Future Semiconductor Technology Lab.
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Modeling of data retention statistics of phase-change memory with confined- and mushroom-type cells

Author(s)
Kwon, YongwooPark, ByoungnamYang, HeesunHwang, Jin-HaKang, Dae-HwanJeong, HongsikSong, Yunheub
Issued Date
2016-08
DOI
10.1016/j.microrel.2016.04.007
URI
https://scholarworks.unist.ac.kr/handle/201301/27128
Fulltext
https://www.sciencedirect.com/science/article/pii/S0026271416300828?via%3Dihub
Citation
MICROELECTRONICS RELIABILITY, v.63, pp.284 - 290
Abstract
Data retention statistics of phase-change memory with two representative cell schemes, confined and mushroom cells, were investigated using phase-field method that can correctly model successive nucleation events and their. growth, simultaneously. Several directions of cell structure engineering are suggested. An interesting point is that reducing only one lateral dimension below a characteristic length can improve the data retention. Most importantly, it was found that the cumulative distribution of the retention time is Weibull for the mushroom cells while that is lognormal for,the confined cells.
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
ISSN
0026-2714
Keyword (Author)
Phase-change memoryData retentionVariabilityNucleation and growthPhase-field method
Keyword
CRYSTAL NUCLEATIONCRYSTALLIZATIONKINETICSRESISTANCESYSTEMIMPACT

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