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Choi, EunMi
THz Vacuum Electronics and Electrodynamics
Research Interests
  • High power millimeter-wave/THz wave, vacuum electronics, plasma breakdown, electron beams, electromagnetics, microwave/RF engineering

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Characterization of the Goubau line for testing beam diagnostic instruments

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Title
Characterization of the Goubau line for testing beam diagnostic instruments
Author
Kim, S. Y.Stulle, F.Sung, C. K.Yoo, K. H.Seok, J.Moon, K. J.Choi, C. U.Chung, Y.Kim, G.Woo, H. J.Kwon, J.Lee, I. G.Choi, EunMiChung, Moses
Issue Date
2017-12
Publisher
IOP PUBLISHING LTD
Citation
JOURNAL OF INSTRUMENTATION, v.12, no.12, pp.P12016
Abstract
One of the main characteristics of the Goubau line is that it supports a low-loss, non-radiated surface wave guided by a dielectric-coated metal wire. The dominant mode of the surface wave along the Goubau line is a TM01 mode, which resembles the pattern of the electromagnetic fields induced in the metallic beam pipe when the charged particle beam passes through it. Therefore, the Goubau line can be used for the preliminary bench test and performance optimization of the beam diagnostic instruments without requiring charged particle beams from the accelerators. In this paper, we discuss the basic properties of the Goubau line for testing beam diagnostic instruments and present the initial test results for button-type beam position monitors (BPMs). The experimental results are consistent with the theoretical estimations, which indicates that Goubau line allows effective testing of beam diagnostic equipment.
URI
https://scholarworks.unist.ac.kr/handle/201301/23157
URL
http://iopscience.iop.org/article/10.1088/1748-0221/12/12/P12016/meta
DOI
10.1088/1748-0221/12/12/P12016
ISSN
1748-0221
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