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최은미

Choi, EunMi
THz Vacuum Electronics and Applied Electromagnetics Lab.
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dc.citation.number 12 -
dc.citation.startPage P12016 -
dc.citation.title JOURNAL OF INSTRUMENTATION -
dc.citation.volume 12 -
dc.contributor.author Kim, S. Y. -
dc.contributor.author Stulle, F. -
dc.contributor.author Sung, C. K. -
dc.contributor.author Yoo, K. H. -
dc.contributor.author Seok, J. -
dc.contributor.author Moon, K. J. -
dc.contributor.author Choi, C. U. -
dc.contributor.author Chung, Y. -
dc.contributor.author Kim, G. -
dc.contributor.author Woo, H. J. -
dc.contributor.author Kwon, J. -
dc.contributor.author Lee, I. G. -
dc.contributor.author Choi, EunMi -
dc.contributor.author Chung, Moses -
dc.date.accessioned 2023-12-21T21:20:25Z -
dc.date.available 2023-12-21T21:20:25Z -
dc.date.created 2017-12-29 -
dc.date.issued 2017-12 -
dc.description.abstract One of the main characteristics of the Goubau line is that it supports a low-loss, non-radiated surface wave guided by a dielectric-coated metal wire. The dominant mode of the surface wave along the Goubau line is a TM01 mode, which resembles the pattern of the electromagnetic fields induced in the metallic beam pipe when the charged particle beam passes through it. Therefore, the Goubau line can be used for the preliminary bench test and performance optimization of the beam diagnostic instruments without requiring charged particle beams from the accelerators. In this paper, we discuss the basic properties of the Goubau line for testing beam diagnostic instruments and present the initial test results for button-type beam position monitors (BPMs). The experimental results are consistent with the theoretical estimations, which indicates that Goubau line allows effective testing of beam diagnostic equipment. -
dc.identifier.bibliographicCitation JOURNAL OF INSTRUMENTATION, v.12, no.12, pp.P12016 -
dc.identifier.doi 10.1088/1748-0221/12/12/P12016 -
dc.identifier.issn 1748-0221 -
dc.identifier.scopusid 2-s2.0-85039791196 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/23157 -
dc.identifier.url http://iopscience.iop.org/article/10.1088/1748-0221/12/12/P12016/meta -
dc.identifier.wosid 000417761100013 -
dc.language 영어 -
dc.publisher IOP PUBLISHING LTD -
dc.title Characterization of the Goubau line for testing beam diagnostic instruments -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Instruments & Instrumentation -
dc.relation.journalResearchArea Instruments & Instrumentation -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Beam-line instrumentation (beam position and profile monitors -
dc.subject.keywordAuthor beam-intensity monitors -
dc.subject.keywordAuthor bunch length monitors) -
dc.subject.keywordAuthor Instrumentation for particle accelerators and storage rings - high energy (linear accelerators, synchrotrons) -
dc.subject.keywordAuthor Instrumentation for particle accelerators and storage rings - low energy (linear accelerators, cyclotrons, electrostatic accelerators) -

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