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Dramatic Reduction of Surface Recombination by in Situ Surface Passivation of Silicon Nanowires

Alternative Title
Dramatic Reduction of Surface Recombination by in Situ Surface Passivation of Silicon Nanowires
Author(s)
Dan, YapingSeo, KwanyongTakei, KuniharuMeza, Jhim H.Javey, AliCrozier, Kenneth B.
Issued Date
2011-06
DOI
10.1021/nl201179n
URI
https://scholarworks.unist.ac.kr/handle/201301/12228
Fulltext
http://pubs.acs.org/doi/abs/10.1021/nl201179n
Citation
NANO LETTERS, v.11, no.6, pp.2527 - 2532
Abstract
Nanowires have unique optical properties(1-4) and are considered as important building blocks for energy harvesting applications such as solar cells.(2,5-8) However, due to their large surface-to-volume ratios, the recombination of charge carriers through surface states reduces the carrier diffusion lengths in nanowires a few orders of magnitude,(9) often resulting in the low efficiency (a few percent or less) of nanowire-based solar cells.(7,8,10,11) Reducing the recombination by surface passivation is crucial for the realization of high-performance nanosized optoelectronic devices but remains largely unexplored.(7,12-14) Here we show that a thin layer of amorphous silicon (a-Si) coated on a single-crystalline silicon nanowire, forming a core shell structure in situ in the vapor-liquid-solid process, reduces the surface recombination nearly 2 orders of magnitude. Under illumination of modulated light, we measure a greater than 90-fold improvement in the photosensitivity of individual core-shell nanowires, compared to regular nanowires without shell. Simulations of the optical absorption of the nanowires indicate that the strong absorption of the a-Si shell contributes to this effect, but we conclude that the effect is mainly due to the enhanced carrier lifetime by surface passivation
Publisher
AMER CHEMICAL SOC
ISSN
1530-6984

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